Using Ultrafast Imaging to Characterize Materials for Power and Quantum Applications

Join Torben Purz, Lead Research Scientist at MONSTR Sense Technologies, for a seminar exploring how advanced ultrafast imaging techniques are enabling the characterization of next-generation materials for power electronics and quantum technologies. Dr. Purz will discuss the KRAKEN Turnkey Ultrafast Microscope and its applications in studying 2D materials, perovskites, wide-bandgap semiconductors, and semiconductor manufacturing processes. The seminar will also feature a live remote demonstration of the KRAKEN system. Coffee and snacks will be served before the seminar.