Reliability Characterization of Ring Oscillator Circuits in Advanced CMOS Technology Nodes

Join the Birck Nanotechnology Center for a seminar by Andreas Kerber, PhD, Senior Principal Engineer at Intel Corporation, on September 17 at 2:00 p.m. in BRK 1001. Dr. Kerber will present “Reliability Characterization of Ring Oscillator Circuits in Advanced CMOS Technology Nodes,” exploring how ring oscillator measurements are used to assess device reliability, aging mechanisms, hot carrier injection effects, and self-heating in advanced CMOS technologies. Drawing on more than two decades of experience in semiconductor reliability at leading organizations including Intel, AMD, GLOBALFOUNDRIES, and Infineon, Dr. Kerber will share insights critical to the development of next-generation microelectronic devices. Coffee and snacks will be served before the seminar, and the event will also be available via MS Teams.