Birck Seminar Series: Atomic Force Microscopy for Defect Characterization and Strain Control of Two-Dimensional Materials

Join Matthew R. Rosenberger from the University of Notre Dame’s Department of Aerospace and Mechanical Engineering as he explores advanced atomic force microscopy (AFM) techniques for identifying defects, analyzing strain, and controlling material properties in two‑dimensional materials. The talk will highlight recent advances in nanoscale defect characterization, strain mapping, and applications to emerging electronic and optoelectronic devices.